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Full-electron calculation of effective electronic couplings and excitation energies of charge transfer states: Application to hole transfer in DNA π-stacks

Articolo
Data di Pubblicazione:
2009
Abstract:
In this work I develop and apply a theoretical method for calculating effective electronic couplings (or transfer integrals) between redox sites involved in hole or electron transfer reactions. The resulting methodology is a refinement and a generalization of a recently developed approach for transfer integral evaluation. In fact, it holds for any overlap between the charge-localized states used to represent charge transfer (CT) processes in the two-state model. The presented theoretical and computational analyses show that the prototype approach is recovered for sufficiently small overlaps. The method does not involve any empirical parameter. It allows a complete multielectron description, therefore including electronic relaxation effects. Furthermore, its theoretical formulation holds at any value of the given reaction coordinate and yields a formula for the evaluation of the vertical excitation energy (i.e., the energy difference between the adiabatic ground and first-excited electronic states) that rests on the same physical quantities used in transfer integral calculation. In this paper the theoretical approach is applied to CT in B-DNA base dimers within the framework of Density Functional Theory (DFT), although it can be implemented in other computational schemes. The results of this work, as compared with previous Hartree-Fock (HF) and post-HF evaluations, support the applicability of the current implementation of the method to larger π -stacked arrays, where post-HF approaches are computationally unfeasible. © 2009 American Institute of Physics.
Tipologia CRIS:
01.01 - Articolo in rivista
Elenco autori:
Migliore, A.
Autori di Ateneo:
MIGLIORE AGOSTINO
Link alla scheda completa:
https://www.research.unipd.it/handle/11577/3365082
Pubblicato in:
THE JOURNAL OF CHEMICAL PHYSICS
Journal
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URL

https://aip.scitation.org/doi/10.1063/1.3232007
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